The 1991 ACM Computing Classification System
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Reliability and Testing
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INTEGRATED CIRCUITS
Reliability and Testing
Term
Metadata
Reliability and Testing
B.7.3
Broader Terms
BT
↑
INTEGRATED CIRCUITS
More specific terms
NT3
↓
Built-in tests
NT3
↓
Error-checking
NT3
↓
Redundant design
NT3
↓
Test generation
NT3
↓
Testability
Date of creation
30-Dec-2011
Accepted term
30-Dec-2011
Descendant terms
5
ARK
ark:/99152/t3l4vpkjvgkyj2
More specific terms
5
Alternative terms
0
Related terms
0
Notes
0
Metadata
BS8723-5
DC
MADS
SKOS-Core
VDEX
XTM
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