The 1991 ACM Computing Classification System
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Test generation
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ARITHMETIC AND LOGIC STRUCTURES
Reliability, Testing, and Fault-Tolerance
Test generation
Term
Metadata
Test generation
Broader Terms
BT
↑
Reliability, Testing, and Fault-Tolerance
Date of creation
30-Dec-2011
Accepted term
30-Dec-2011
Descendant terms
0
ARK
ark:/99152/t32xl9n0qykj57
More specific terms
0
Alternative terms
0
Related terms
0
Notes
0
Metadata
BS8723-5
DC
MADS
SKOS-Core
VDEX
XTM
Zthes
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