The 1998 ACM Computing Classification System
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Reliability and Testing
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INTEGRATED CIRCUITS
Reliability and Testing
Term
Metadata
Reliability and Testing
Historical note
This classification is no longer used as of January 1998, but that the item is still searchable for previously classified documents.
B.7.3
Broader Terms
BT
↑
INTEGRATED CIRCUITS
More specific terms
NT3
↓
Built-in tests
NT3
↓
Error-checking
NT3
↓
Redundant design
NT3
↓
Test generation
NT3
↓
Testability
Related terms
RT
⇆
PERFORMANCE AND RELIABILITY
Date of creation
30-Dec-2011
Modified
02-Jan-2012
Accepted term
30-Dec-2011
Descendant terms
5
ARK
ark:/99152/t3kd7wol3do41v
More specific terms
5
Alternative terms
0
Related terms
1
Notes
1
Metadata
BS8723-5
DC
MADS
SKOS-Core
VDEX
XTM
Zthes
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