The 1998 ACM Computing Classification System
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Test generation
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INTEGRATED CIRCUITS
Reliability and Testing
Test generation
Term
Metadata
Test generation
Historical note
This classification is no longer used as of January 1998, but that the item is still searchable for previously classified documents.
Broader Terms
BT
↑
Reliability and Testing
Date of creation
30-Dec-2011
Accepted term
30-Dec-2011
Descendant terms
0
ARK
ark:/99152/t34j7e8320odq0
More specific terms
0
Alternative terms
0
Related terms
0
Notes
1
Metadata
BS8723-5
DC
MADS
SKOS-Core
VDEX
XTM
Zthes
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