The 1998 ACM Computing Classification System
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Control Structure Reliability, Testing, and Fault-Tolerance
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CONTROL STRUCTURES AND MICROPROGRAMMING
Control Structure Reliability, Testing, and Fault-Tolerance
Term
Metadata
Control Structure Reliability, Testing, and Fault-Tolerance
Historical note
This classification is no longer used as of January 1998, but that the item is still searchable for previously classified documents.
B.1.3
Broader Terms
BT
↑
CONTROL STRUCTURES AND MICROPROGRAMMING
More specific terms
NT3
↓
Diagnostics
NT3
↓
Error-checking
NT3
↓
Redundant design
NT3
↓
Test generation
Related terms
RT
⇆
PERFORMANCE AND RELIABILITY
Date of creation
30-Dec-2011
Modified
02-Jan-2012
Accepted term
30-Dec-2011
Descendant terms
4
ARK
ark:/99152/t30n14oyvok5p3
More specific terms
4
Alternative terms
0
Related terms
1
Notes
1
Metadata
BS8723-5
DC
MADS
SKOS-Core
VDEX
XTM
Zthes
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